The IND nanoindentation tester system of Semilab is designed to provide a controlled load and deformation of the material being tested. The mechanical response of the material is measured via force and displacement sensors. The range of the actuator, force and displacement sensors, is on the micro- and nanoscale with resolution of nanonewtons and nanometers. The precise nature of the measurement enables us events on the micro- to nanoscale to be recorded. Macroscale damage can thus be interpreted and explained by events on the submicron scale thus allowing the fundamental properties of the sample to be studied and tailored for specific applications.

The force sensor of IND system tools is completely separate from the load actuator and measures the force applied to the indenter directly. Force and depth sensors are independently calibrated against international standards. Closed loop feedback can be selected either for the force or for the depth sensor. Open loop mode of operation for high speed data acquisition is also possible to select. The IND system is almost immune to mechanical breakage due to a specially designed safety gap between the shaft and piezo actuator. Nanoindenter systems use rugged LVDT sensors for both force and depth measurements. Advanced AC amplification provides mV noise floor. Special circuitry offsets the signal to take advantage of the full range of analog to digital converter.